Composition-Dependent Structural Properties of Bi2Te3xSe3(1-x) Ternary Thin Films

Author(s): G.D. Deshmukh

Abstract:

Ternary bismuth telluride-selenide (Bi2Te3xSe3(1-x)) thin films have emerged as promising materials for thermoelectric and topological insulator applications due to their tunable electronic and structural properties. This study investigates the composition-dependent structural evolution of Bi2Te3xSe3(1-x) thin films across the complete compositional range (0 ≤ x ≤ 1). X-ray diffraction analysis reveals that these ternary alloys maintain the rhombohedral structure represented in the hexagonal lattice strongly orientated along (1010) direction. The difference in d-values and lattice parameter values ‘a’ with composition obeys Vegard’s law. The structural parameters such as grain size, microstrain and dislocation density are fairly depending on composition. The grain size observed is about 25-50 nm. These findings provide fundamental insights into the structure-composition relationships essential for advancing applications in next-generation thermoelectric devices and quantum electronics.

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